University of Arizona (UA)

Electrical and Computer Engineering Department (ECE)

1999 Guest Scientist at Center for Microcontamination Control (CMC)

This six weeks short-term employment at UA aimed at the adaptation and initial operation and control of a quadrupole-mass-spectrometer based analytical system for the measurement of BHT contaminations on Si-wafer surfaces. Work was performed in cooperation with J. O'Hanlon (head of CMC), H.G. "Skip" Parks (senior scientist at UA), and Z. Rouf (Ph.D. student).